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Journal Articles

Adsorption mechanism of ReO$$_{4}$$$$^{-}$$ on Ni-Zn layered hydroxide salt and its application to removal of ReO$$_{4}$$$$^{-}$$ as a surrogate of TcO$$_{4}$$$$^{-}$$

Tanaka, Kazuya; Kozai, Naofumi; Yamasaki, Shinya*; Onuki, Toshihiko; Kaplan, D. I.*; Grambow, B.

Applied Clay Science, 182, p.105282_1 - 105282_8, 2019/12

 Times Cited Count:16 Percentile:69.69(Chemistry, Physical)

In this study, Ni-Zn layered hydroxide salt (LHS) was used for adsorption experiments of ReO$$_{4}$$$$^{-}$$, as a surrogate of TcO$$_{4}$$$$^{-}$$, in aqueous solutions with various initial Re and sodium salt concentrations. The maximum adsorption amount of Re was estimated at 127.7 mg/g (6.86 $$times$$ 10$$^{-4}$$ eq/g) by fitting adsorption isotherm of ReO$$_{4}$$$$^{-}$$ to Langmuir plot. The adsorption of ReO$$_{4}$$$$^{-}$$ at neutral pH was a reversible process by anion exchange, and decreased with increasing Cl$$^{-}$$, NO$$_{3}$$$$^{-}$$ and SO$$_{4}$$$$^{2-}$$ in solution. EXAFS analysis indicated that ReO$$_{4}$$$$^{-}$$ was adsorbed as an outer-sphere complex on Ni-Zn LHS. The Ni-Zn LHS is a more robust adsorbent for ReO$$_{4}$$$$^{-}$$ than the Mg-Al LDH in terms of solution pH and tolerance to competing anions, and may be an effective alternative to the traditional and more limited method of removing aqueous TcO$$_{4}$$$$^{-}$$ by reductive precipitation.

Journal Articles

Photoemission and core-level absorption spectroscopy of Fe$$_{x}$$NbS$$_{2}$$

Saito, Yuji; Kobayashi, Keisuke*; Fujimori, Atsushi; Yamamura, Yasuhisa*; Koyano, Mikio*; Tsuji, Toshihide*; Katayama, Shinichi*

Journal of Electron Spectroscopy and Related Phenomena, 144-147, p.829 - 832, 2005/06

 Times Cited Count:5 Percentile:27.33(Spectroscopy)

no abstracts in English

Journal Articles

Coupling of longitudinal phonons with transverse Einstein mode in C$$_{2}$$$$_{4}$$Rb

; ; *

Physica B; Condensed Matter, 120, p.305 - 309, 1983/00

no abstracts in English

Journal Articles

Phonon dispersion relations in C$$_{2}$$$$_{4}$$Rb

; *;

Solid State Communications, 44(11), p.1515 - 1517, 1982/00

 Times Cited Count:9 Percentile:44.67(Physics, Condensed Matter)

no abstracts in English

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